Electrical-Optical-Electrical (EOE) systems typically represent repeaters and must be converted to IBIS-AMI models to be used in SerDes Channel Simulators. Today, the IBIS-AMI modeling process has matured so that the process can be automated. This allows the EOE device developer to extract data from their hardware for use in an IBIS-AMI model. Electrical characteristics can be captured with S-parameters or time domain waveforms. Optical characteristics, such as for highly nonlinear VCSEL devices, can be captured using optical instruments. This paper proposes a new methodology for automatically creating EOE IBIS-AMI Repeater Models based on EOE device measurements.