Proposal for Automated E-O-E IBIS-AMI Modeling

Event Time

Originally Aired - Wednesday, August 18 8:00 AM - 8:40 AM

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Event Location

Location: Exec Ballroom 210B


Event Information

Title: Proposal for Automated E-O-E IBIS-AMI Modeling

Event Type: DesignCon - Technical Session

Pass Type: All-Access Pass, 2-Day Pass

Theme: 5G


Description

Electrical-Optical-Electrical (EOE) systems typically represent repeaters and must be converted to IBIS-AMI models to be used in SerDes Channel Simulators.  Today, the IBIS-AMI modeling process has matured so that the process can be automated.   This allows the EOE device developer to extract data from their hardware for use in an IBIS-AMI model.  Electrical characteristics can be captured with S-parameters or time domain waveforms.  Optical characteristics, such as for highly nonlinear VCSEL devices, can be captured using optical instruments.  This paper proposes a new methodology for automatically creating EOE IBIS-AMI Repeater Models based on EOE device measurements.


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